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Goodness-of-fit tests based on new characterizations of the exponential distribution

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dc.contributor.advisor Swanepoel H, Prof en
dc.contributor.author Weideman HM en
dc.date.accessioned 2016-09-22T06:59:45Z
dc.date.available 2016-09-22T06:59:45Z
dc.date.created 2003 en
dc.identifier.uri http://hdl.handle.net/20.500.11892/6131
dc.language English en
dc.subject Mathematics, mathematical statistics and statistics en
dc.subject Statistics: Diverse (Biometry, etc.) en
dc.title Goodness-of-fit tests based on new characterizations of the exponential distribution en
dc.type Doctoral degree en
dc.description.degree PhD en


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